subject: Defect Reduction In Testing Projects Using Hmp Techniques [print this page] Testing is a very important function in the software development lifecycle and thus is given a lot of importance in different software process improvement models and frameworks like the ISO and the CMMI-DEV ML3. Verification and validation process areas of CMMI-DEV ML3 cover the aspects related to testing of the product. An effective test strategy is one which has maximum code coverage so that it can detect almost all the possible defects, the defect data that is collected should be analyzed for improving the processes to help in reducing the number of defects and improving the product quality.
In this paper the author explains step by step approach for Defect reduction using CMMI High Maturity Techniques. The steps explained in the paper are:
> Data collection
> Identification of critical defect types
> Building Process Performance Models (PPMs)
> Sub-process monitoring
> Checking for sustenance
The paper shows how practically techniques like hypothesis testing, Crystal Ball sensitivity analysis, fishbone diagram etc can be used to analyze the data and use the same for devising methods for defect reduction.
The paper begins by explaining what are defects the common defect types and causes and then explains the approach for defect reduction.
Some excerpts from the paper are as given below:
Defect Definition:
"When these test cases are insufficient, defects will leak and create performance issues in the application. Any such defect unidentified by testing is termed as "Defect" in Testing Projects. These defects are usually categorized under common defect types like:- Missing Functional Test Cases, Incorrect Test Cases, Inadequate Test Coverage."
Data Collection Methods:
"Defect Data are collected on a event driven basis from various tools available in the organization:
> Defects reported by customer through UAT
> Defects in Project Specific Process
> Peer Review Defect Log
> Project Specific Tools - HPQC, JIRA, Bugzilla"
Usage of techniques in the paper:
"Perform One Way ANOVA to identify Critical Defect Type"
"Defect type Sensitivity analysis is done using the crystal ball tool run simulations and derive the tornado plots."
"To identify the root cause for Critical Defect Types, CAPA meeting is being performed and 5 Y technique is used to identify the root cause."
Hariharan Ramadurai is working with HCL as Deputy Manager Quality Assurance and has contributed significantly to quality and software process improvement areas. He has a process consulting focus into Business Process Excellence through effective implementation of High maturity practices. He has 11+ years of experience in Operations and Quality management spanning across domains including CRM, HR and BFSI, as a CMMI-DEV consultant. He specializes in training and coaching on various Quality standards like ISO 9001, BS 7799, ISO 20000 and CMMI High Maturity Practices.
